A latent class approach to estimating test-score reliability

L.A. van der Ark, D.W. van der Palm, K. Sijtsma

Research output: Contribution to journalArticleScientificpeer-review

111 Downloads (Pure)
Original languageEnglish
Pages (from-to)380-392
JournalApplied Psychological Measurement
Volume35
Issue number5
DOIs
Publication statusPublished - 2011

Cite this

van der Ark, L.A. ; van der Palm, D.W. ; Sijtsma, K. / A latent class approach to estimating test-score reliability. In: Applied Psychological Measurement. 2011 ; Vol. 35, No. 5. pp. 380-392.
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A latent class approach to estimating test-score reliability. / van der Ark, L.A.; van der Palm, D.W.; Sijtsma, K.

In: Applied Psychological Measurement, Vol. 35, No. 5, 2011, p. 380-392.

Research output: Contribution to journalArticleScientificpeer-review

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T1 - A latent class approach to estimating test-score reliability

AU - van der Ark, L.A.

AU - van der Palm, D.W.

AU - Sijtsma, K.

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U2 - 10.1177/0146621610392911

DO - 10.1177/0146621610392911

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EP - 392

JO - Applied Psychological Measurement

JF - Applied Psychological Measurement

SN - 0146-6216

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