A note on exponential dispersion models which are invariant under length-biased sampling

S.K. Bar-Lev, F.A. van der Duyn Schouten

Research output: Contribution to journalArticleScientificpeer-review

1 Citation (Scopus)
Original languageEnglish
Pages (from-to)275-284
Number of pages9
JournalStatistics & probability letters
Volume70
Issue number4
Publication statusPublished - 2004

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