Applications of Likelihood-Based Methods for the Reliability Parameter of the Location and Scale Exponential Distribution

F.A. van der Duyn Schouten; S.K. Bar-Lev

Applications of Likelihood-Based Methods for the Reliability Parameter of the Location and Scale Exponential Distribution

F.A. van der Duyn Schouten, S.K. Bar-Lev

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Abstract

Based on a type-2 censored sample we consider a likelihood-based inference for the reliability parameter R(t) of the location and scale exponential distribution.More specifically, we derive the profile and marginal likelihoods of R(t).A numerical example is presented demonstrating the flavor of results that can be obtained by likelihood-based methods.

Original language	English
Place of Publication	Tilburg
Publisher	Operations research
Number of pages	16
Volume	2003-83
Publication status	Published - 2003

Publication series

Name	CentER Discussion Paper
Volume	2003-83

Keywords

testing
statistical methods
distribution
maximum likelihood
reliability

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@techreport{06d6e3e79d77468b95f9f6f24cf42182,

title = "Applications of Likelihood-Based Methods for the Reliability Parameter of the Location and Scale Exponential Distribution",

abstract = "Based on a type-2 censored sample we consider a likelihood-based inference for the reliability parameter R(t) of the location and scale exponential distribution.More specifically, we derive the profile and marginal likelihoods of R(t).A numerical example is presented demonstrating the flavor of results that can be obtained by likelihood-based methods.",

keywords = "testing, statistical methods, distribution, maximum likelihood, reliability",

author = "{van der Duyn Schouten}, F.A. and S.K. Bar-Lev",

note = "Pagination: 16",

year = "2003",

language = "English",

volume = "2003-83",

series = "CentER Discussion Paper",

publisher = "Operations research",

type = "WorkingPaper",

institution = "Operations research",

}

TY - UNPB

T1 - Applications of Likelihood-Based Methods for the Reliability Parameter of the Location and Scale Exponential Distribution

AU - van der Duyn Schouten, F.A.

AU - Bar-Lev, S.K.

N1 - Pagination: 16

PY - 2003

Y1 - 2003

N2 - Based on a type-2 censored sample we consider a likelihood-based inference for the reliability parameter R(t) of the location and scale exponential distribution.More specifically, we derive the profile and marginal likelihoods of R(t).A numerical example is presented demonstrating the flavor of results that can be obtained by likelihood-based methods.

AB - Based on a type-2 censored sample we consider a likelihood-based inference for the reliability parameter R(t) of the location and scale exponential distribution.More specifically, we derive the profile and marginal likelihoods of R(t).A numerical example is presented demonstrating the flavor of results that can be obtained by likelihood-based methods.

KW - testing

KW - statistical methods

KW - distribution

KW - maximum likelihood

KW - reliability

M3 - Discussion paper

VL - 2003-83

T3 - CentER Discussion Paper

BT - Applications of Likelihood-Based Methods for the Reliability Parameter of the Location and Scale Exponential Distribution

PB - Operations research

CY - Tilburg

ER -

Applications of Likelihood-Based Methods for the Reliability Parameter of the Location and Scale Exponential Distribution

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