Applications of Likelihood-Based Methods for the Reliability Parameter of the Location and Scale Exponential Distribution

F.A. van der Duyn Schouten, S.K. Bar-Lev

Research output: Working paperDiscussion paperOther research output

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Abstract

Based on a type-2 censored sample we consider a likelihood-based inference for the reliability parameter R(t) of the location and scale exponential distribution.More specifically, we derive the profile and marginal likelihoods of R(t).A numerical example is presented demonstrating the flavor of results that can be obtained by likelihood-based methods.
Original languageEnglish
Place of PublicationTilburg
PublisherOperations research
Number of pages16
Volume2003-83
Publication statusPublished - 2003

Publication series

NameCentER Discussion Paper
Volume2003-83

Fingerprint

Exponential distribution
Likelihood
Profile Likelihood
Marginal Likelihood
Censored Samples
Numerical Examples

Keywords

  • testing
  • statistical methods
  • distribution
  • maximum likelihood
  • reliability

Cite this

van der Duyn Schouten, F. A., & Bar-Lev, S. K. (2003). Applications of Likelihood-Based Methods for the Reliability Parameter of the Location and Scale Exponential Distribution. (CentER Discussion Paper; Vol. 2003-83). Tilburg: Operations research.
van der Duyn Schouten, F.A. ; Bar-Lev, S.K. / Applications of Likelihood-Based Methods for the Reliability Parameter of the Location and Scale Exponential Distribution. Tilburg : Operations research, 2003. (CentER Discussion Paper).
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van der Duyn Schouten, FA & Bar-Lev, SK 2003 'Applications of Likelihood-Based Methods for the Reliability Parameter of the Location and Scale Exponential Distribution' CentER Discussion Paper, vol. 2003-83, Operations research, Tilburg.

Applications of Likelihood-Based Methods for the Reliability Parameter of the Location and Scale Exponential Distribution. / van der Duyn Schouten, F.A.; Bar-Lev, S.K.

Tilburg : Operations research, 2003. (CentER Discussion Paper; Vol. 2003-83).

Research output: Working paperDiscussion paperOther research output

TY - UNPB

T1 - Applications of Likelihood-Based Methods for the Reliability Parameter of the Location and Scale Exponential Distribution

AU - van der Duyn Schouten, F.A.

AU - Bar-Lev, S.K.

N1 - Pagination: 16

PY - 2003

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N2 - Based on a type-2 censored sample we consider a likelihood-based inference for the reliability parameter R(t) of the location and scale exponential distribution.More specifically, we derive the profile and marginal likelihoods of R(t).A numerical example is presented demonstrating the flavor of results that can be obtained by likelihood-based methods.

AB - Based on a type-2 censored sample we consider a likelihood-based inference for the reliability parameter R(t) of the location and scale exponential distribution.More specifically, we derive the profile and marginal likelihoods of R(t).A numerical example is presented demonstrating the flavor of results that can be obtained by likelihood-based methods.

KW - testing

KW - statistical methods

KW - distribution

KW - maximum likelihood

KW - reliability

M3 - Discussion paper

VL - 2003-83

T3 - CentER Discussion Paper

BT - Applications of Likelihood-Based Methods for the Reliability Parameter of the Location and Scale Exponential Distribution

PB - Operations research

CY - Tilburg

ER -

van der Duyn Schouten FA, Bar-Lev SK. Applications of Likelihood-Based Methods for the Reliability Parameter of the Location and Scale Exponential Distribution. Tilburg: Operations research. 2003. (CentER Discussion Paper).