Applications of Likelihood-Based Methods for the Reliability Parameter of the Location and Scale Exponential Distribution

F.A. van der Duyn Schouten, S.K. Bar-Lev

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Abstract

Based on a type-2 censored sample we consider a likelihood-based inference for the reliability parameter R(t) of the location and scale exponential distribution.More specifically, we derive the profile and marginal likelihoods of R(t).A numerical example is presented demonstrating the flavor of results that can be obtained by likelihood-based methods.
Original languageEnglish
Place of PublicationTilburg
PublisherOperations research
Number of pages16
Volume2003-83
Publication statusPublished - 2003

Publication series

NameCentER Discussion Paper
Volume2003-83

Keywords

  • testing
  • statistical methods
  • distribution
  • maximum likelihood
  • reliability

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    van der Duyn Schouten, F. A., & Bar-Lev, S. K. (2003). Applications of Likelihood-Based Methods for the Reliability Parameter of the Location and Scale Exponential Distribution. (CentER Discussion Paper; Vol. 2003-83). Operations research.