Applications of likelihood-based methods for the reliability parameter of the location and scale exponential distribution

S.K. Bar-Lev, F.A. van der Duyn Schouten

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Original language	English
Pages (from-to)	115-126
Journal	Journal of Applied Statistical Science
Volume	16
Issue number	1
Publication status	Published - 2007

Cite this

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title = "Applications of likelihood-based methods for the reliability parameter of the location and scale exponential distribution",

author = "S.K. Bar-Lev and {van der Duyn Schouten}, F.A.",

note = "DP 2003-83",

year = "2007",

language = "English",

volume = "16",

pages = "115--126",

journal = "Journal of Applied Statistical Science",

issn = "1067-5817",

publisher = "Nova Science Publishers Inc",

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}

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T1 - Applications of likelihood-based methods for the reliability parameter of the location and scale exponential distribution

AU - Bar-Lev, S.K.

AU - van der Duyn Schouten, F.A.

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PY - 2007

Y1 - 2007

M3 - Article

VL - 16

SP - 115

EP - 126

JO - Journal of Applied Statistical Science

JF - Journal of Applied Statistical Science

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