Original language | English |
---|---|
Pages (from-to) | 115-126 |
Journal | Journal of Applied Statistical Science |
Volume | 16 |
Issue number | 1 |
Publication status | Published - 2007 |
Applications of likelihood-based methods for the reliability parameter of the location and scale exponential distribution
S.K. Bar-Lev, F.A. van der Duyn Schouten
Research output: Contribution to journal › Article › Scientific › peer-review
230
Downloads
(Pure)