Abstract
This paper surveys the most prominent formalisms for availability and reliability analysis and discusses the pros and cons of these approaches. Based on our findings, we outline a solution that unites the merits of the existing approaches into a sound architectural dependability model.
Original language | English |
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Publisher | Centre for Telematics and Information Technology (CTIT) |
Number of pages | 5 |
Place of Publication | Enschede |
Publication status | Published - Sept 2007 |
Externally published | Yes |
Keywords
- EWI-11030
- IR-64339
- METIS-241897