Dealing with risk in incident management: An application of high reliability theory

G.G.P. van den Eede, B.A. van de Walle, A.F. Rutkowski

    Research output: Chapter in Book/Report/Conference proceedingChapterScientificpeer-review

    10 Citations (Scopus)
    Original languageEnglish
    Title of host publicationProceedings of the 39th Annual Hawaii International Conference on System Sciences (HICSS 06)
    EditorsR. Sprague
    Place of PublicationWashington
    PublisherIEEE Press
    Pages37C
    DOIs
    Publication statusPublished - 2006

    Cite this

    van den Eede, G. G. P., van de Walle, B. A., & Rutkowski, A. F. (2006). Dealing with risk in incident management: An application of high reliability theory. In R. Sprague (Ed.), Proceedings of the 39th Annual Hawaii International Conference on System Sciences (HICSS 06) (pp. 37C). IEEE Press. https://doi.org/10.1109/hicss.2006.112