Dealing with risk in incident management

An application of high reliability theory

G.G.P. van den Eede, B.A. van de Walle, A.F. Rutkowski

    Research output: Chapter in Book/Report/Conference proceedingChapterScientificpeer-review

    Original languageEnglish
    Title of host publicationProceedings of the 39th Annual Hawaii International Conference on System Sciences (HICSS 06)
    EditorsR. Sprague
    Place of PublicationWashington
    PublisherIEEE Press
    Pages37C
    DOIs
    Publication statusPublished - 2006

    Cite this

    van den Eede, G. G. P., van de Walle, B. A., & Rutkowski, A. F. (2006). Dealing with risk in incident management: An application of high reliability theory. In R. Sprague (Ed.), Proceedings of the 39th Annual Hawaii International Conference on System Sciences (HICSS 06) (pp. 37C). Washington: IEEE Press. https://doi.org/10.1109/hicss.2006.112
    van den Eede, G.G.P. ; van de Walle, B.A. ; Rutkowski, A.F. / Dealing with risk in incident management : An application of high reliability theory. Proceedings of the 39th Annual Hawaii International Conference on System Sciences (HICSS 06). editor / R. Sprague. Washington : IEEE Press, 2006. pp. 37C
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    title = "Dealing with risk in incident management: An application of high reliability theory",
    author = "{van den Eede}, G.G.P. and {van de Walle}, B.A. and A.F. Rutkowski",
    year = "2006",
    doi = "10.1109/hicss.2006.112",
    language = "English",
    pages = "37C",
    editor = "R. Sprague",
    booktitle = "Proceedings of the 39th Annual Hawaii International Conference on System Sciences (HICSS 06)",
    publisher = "IEEE Press",

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    van den Eede, GGP, van de Walle, BA & Rutkowski, AF 2006, Dealing with risk in incident management: An application of high reliability theory. in R Sprague (ed.), Proceedings of the 39th Annual Hawaii International Conference on System Sciences (HICSS 06). IEEE Press, Washington, pp. 37C. https://doi.org/10.1109/hicss.2006.112

    Dealing with risk in incident management : An application of high reliability theory. / van den Eede, G.G.P.; van de Walle, B.A.; Rutkowski, A.F.

    Proceedings of the 39th Annual Hawaii International Conference on System Sciences (HICSS 06). ed. / R. Sprague. Washington : IEEE Press, 2006. p. 37C.

    Research output: Chapter in Book/Report/Conference proceedingChapterScientificpeer-review

    TY - CHAP

    T1 - Dealing with risk in incident management

    T2 - An application of high reliability theory

    AU - van den Eede, G.G.P.

    AU - van de Walle, B.A.

    AU - Rutkowski, A.F.

    PY - 2006

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    U2 - 10.1109/hicss.2006.112

    DO - 10.1109/hicss.2006.112

    M3 - Chapter

    SP - 37C

    BT - Proceedings of the 39th Annual Hawaii International Conference on System Sciences (HICSS 06)

    A2 - Sprague, R.

    PB - IEEE Press

    CY - Washington

    ER -

    van den Eede GGP, van de Walle BA, Rutkowski AF. Dealing with risk in incident management: An application of high reliability theory. In Sprague R, editor, Proceedings of the 39th Annual Hawaii International Conference on System Sciences (HICSS 06). Washington: IEEE Press. 2006. p. 37C https://doi.org/10.1109/hicss.2006.112