Dealing with risk in incident management: An application of high reliability theory

G.G.P. van den Eede, B.A. van de Walle, A.F. Rutkowski

    Research output: Chapter in Book/Report/Conference proceedingChapterScientificpeer-review

    13 Citations (Scopus)
    Original languageEnglish
    Title of host publicationProceedings of the 39th Annual Hawaii International Conference on System Sciences (HICSS 06)
    EditorsR. Sprague
    Place of PublicationWashington
    PublisherIEEE Press
    Publication statusPublished - 2006

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