Dealing with risk in incident management: An application of high reliability theory

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Scientific › peer-review

Original language	English
Title of host publication	Proceedings of the 39th Annual Hawaii International Conference on System Sciences (HICSS 06)
Editors	R. Sprague
Place of Publication	Washington
Publisher	IEEE Press
Pages	37C
DOIs	https://doi.org/10.1109/hicss.2006.112
Publication status	Published - 2006

Access to Document

@inbook{e102e34e773b403ea4e467af5fb81c50,

title = "Dealing with risk in incident management: An application of high reliability theory",

author = "\{van den Eede\}, G.G.P. and \{van de Walle\}, B.A. and A.F. Rutkowski",

year = "2006",

doi = "10.1109/hicss.2006.112",

language = "English",

pages = "37C",

editor = "R. Sprague",

booktitle = "Proceedings of the 39th Annual Hawaii International Conference on System Sciences (HICSS 06)",

publisher = "IEEE Press",

}

Dealing with risk in incident management: An application of high reliability theory. / van den Eede, G.G.P.; van de Walle, B.A.; Rutkowski, A.F.
Proceedings of the 39th Annual Hawaii International Conference on System Sciences (HICSS 06). ed. / R. Sprague. Washington: IEEE Press, 2006. p. 37C.

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Scientific › peer-review

TY - CHAP

T1 - Dealing with risk in incident management

T2 - An application of high reliability theory

AU - van den Eede, G.G.P.

AU - van de Walle, B.A.

AU - Rutkowski, A.F.

PY - 2006

Y1 - 2006

U2 - 10.1109/hicss.2006.112

DO - 10.1109/hicss.2006.112

M3 - Chapter

SP - 37C

BT - Proceedings of the 39th Annual Hawaii International Conference on System Sciences (HICSS 06)

A2 - Sprague, R.

PB - IEEE Press

CY - Washington

ER -