Design-for-testability of PLA's using statistical cooling

M.M. Ligthart; E.H.L. Aarts; F.P.M. Beenker

doi:10.1109/DAC.1986.1586110

Design-for-testability of PLA's using statistical cooling

M.M. Ligthart, E.H.L. Aarts, F.P.M. Beenker

Research output: Other contribution

12 Citations (Scopus)

Abstract

A method for designing easily testable PLA's with low overhead is presented. The method is based on a reduction of product lines and the addition of a small number of inputs. The required additional hardware is calculated using a statistical cooling algorithm. The presented design-for-testability method guarantees a 100 percent fault coverage with respect to multiple stuck-at faults and multiple missing/extra crosspoint faults.

Original language	English
Number of pages	7
DOIs	https://doi.org/10.1109/DAC.1986.1586110
Publication status	Published - 1986
Externally published	Yes

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10.1109/DAC.1986.1586110

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title = "Design-for-testability of PLA's using statistical cooling",

abstract = "A method for designing easily testable PLA's with low overhead is presented. The method is based on a reduction of product lines and the addition of a small number of inputs. The required additional hardware is calculated using a statistical cooling algorithm. The presented design-for-testability method guarantees a 100 percent fault coverage with respect to multiple stuck-at faults and multiple missing/extra crosspoint faults.",

author = "M.M. Ligthart and E.H.L. Aarts and F.P.M. Beenker",

year = "1986",

doi = "10.1109/DAC.1986.1586110",

language = "English",

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AU - Ligthart, M.M.

AU - Aarts, E.H.L.

AU - Beenker, F.P.M.

PY - 1986

Y1 - 1986

N2 - A method for designing easily testable PLA's with low overhead is presented. The method is based on a reduction of product lines and the addition of a small number of inputs. The required additional hardware is calculated using a statistical cooling algorithm. The presented design-for-testability method guarantees a 100 percent fault coverage with respect to multiple stuck-at faults and multiple missing/extra crosspoint faults.

AB - A method for designing easily testable PLA's with low overhead is presented. The method is based on a reduction of product lines and the addition of a small number of inputs. The required additional hardware is calculated using a statistical cooling algorithm. The presented design-for-testability method guarantees a 100 percent fault coverage with respect to multiple stuck-at faults and multiple missing/extra crosspoint faults.

U2 - 10.1109/DAC.1986.1586110

DO - 10.1109/DAC.1986.1586110

M3 - Other contribution

ER -

Design-for-testability of PLA's using statistical cooling

Abstract

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