Design-for-testability of PLA's using statistical cooling

M.M. Ligthart, E.H.L. Aarts, F.P.M. Beenker

Research output: Other contribution

10 Citations (Scopus)

Abstract

A method for designing easily testable PLA's with low overhead is presented. The method is based on a reduction of product lines and the addition of a small number of inputs. The required additional hardware is calculated using a statistical cooling algorithm. The presented design-for-testability method guarantees a 100 percent fault coverage with respect to multiple stuck-at faults and multiple missing/extra crosspoint faults.
Original languageEnglish
Number of pages7
DOIs
Publication statusPublished - 1986
Externally publishedYes

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