Design-for-testability of PLA's using statistical cooling

M.M. Ligthart, E.H.L. Aarts, F.P.M. Beenker

Research output: Other contributionOther research output

Abstract

A method for designing easily testable PLA's with low overhead is presented. The method is based on a reduction of product lines and the addition of a small number of inputs. The required additional hardware is calculated using a statistical cooling algorithm. The presented design-for-testability method guarantees a 100 percent fault coverage with respect to multiple stuck-at faults and multiple missing/extra crosspoint faults.
Original languageEnglish
Number of pages7
DOIs
Publication statusPublished - 1986
Externally publishedYes

Fingerprint

Design for testability
Cooling
Hardware

Cite this

@misc{8a2be791bbbb48efb03aa69e344dac3c,
title = "Design-for-testability of PLA's using statistical cooling",
abstract = "A method for designing easily testable PLA's with low overhead is presented. The method is based on a reduction of product lines and the addition of a small number of inputs. The required additional hardware is calculated using a statistical cooling algorithm. The presented design-for-testability method guarantees a 100 percent fault coverage with respect to multiple stuck-at faults and multiple missing/extra crosspoint faults.",
author = "M.M. Ligthart and E.H.L. Aarts and F.P.M. Beenker",
year = "1986",
doi = "10.1109/DAC.1986.1586110",
language = "English",
type = "Other",

}

Design-for-testability of PLA's using statistical cooling. / Ligthart, M.M.; Aarts, E.H.L.; Beenker, F.P.M.

7 p. 1986, .

Research output: Other contributionOther research output

TY - GEN

T1 - Design-for-testability of PLA's using statistical cooling

AU - Ligthart, M.M.

AU - Aarts, E.H.L.

AU - Beenker, F.P.M.

PY - 1986

Y1 - 1986

N2 - A method for designing easily testable PLA's with low overhead is presented. The method is based on a reduction of product lines and the addition of a small number of inputs. The required additional hardware is calculated using a statistical cooling algorithm. The presented design-for-testability method guarantees a 100 percent fault coverage with respect to multiple stuck-at faults and multiple missing/extra crosspoint faults.

AB - A method for designing easily testable PLA's with low overhead is presented. The method is based on a reduction of product lines and the addition of a small number of inputs. The required additional hardware is calculated using a statistical cooling algorithm. The presented design-for-testability method guarantees a 100 percent fault coverage with respect to multiple stuck-at faults and multiple missing/extra crosspoint faults.

U2 - 10.1109/DAC.1986.1586110

DO - 10.1109/DAC.1986.1586110

M3 - Other contribution

ER -