Original language | English |
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Pages (from-to) | 261-272 |
Number of pages | 12 |
Journal | Applied Measurement in Education |
Volume | 8 |
Issue number | 3 |
Publication status | Published - 1995 |
Externally published | Yes |
Detection of aberrant item score patterns: A review of recent developments
R.R. Meijer, K. Sijtsma
Research output: Contribution to journal › Article › Professional
72
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