Detection of aberrant item score patterns: A review of recent developments

R.R. Meijer, K. Sijtsma

Research output: Contribution to journalArticleProfessional

72 Citations (Scopus)
136 Downloads (Pure)
Original languageEnglish
Pages (from-to)261-272
Number of pages12
JournalApplied Measurement in Education
Volume8
Issue number3
Publication statusPublished - 1995
Externally publishedYes

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