Detection of aberrant item score patterns: A review of recent developments

R.R. Meijer, K. Sijtsma

Research output: Contribution to journalArticleProfessional

97 Downloads (Pure)
Original languageEnglish
Pages (from-to)261-272
Number of pages12
JournalApplied Measurement in Education
Volume8
Issue number3
Publication statusPublished - 1995
Externally publishedYes

Cite this

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title = "Detection of aberrant item score patterns: A review of recent developments",
author = "R.R. Meijer and K. Sijtsma",
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year = "1995",
language = "English",
volume = "8",
pages = "261--272",
journal = "Applied Measurement in Education",
issn = "0895-7347",
publisher = "Routledge",
number = "3",

}

Detection of aberrant item score patterns : A review of recent developments. / Meijer, R.R.; Sijtsma, K.

In: Applied Measurement in Education, Vol. 8, No. 3, 1995, p. 261-272.

Research output: Contribution to journalArticleProfessional

TY - JOUR

T1 - Detection of aberrant item score patterns

T2 - A review of recent developments

AU - Meijer, R.R.

AU - Sijtsma, K.

N1 - Pagination: 12

PY - 1995

Y1 - 1995

M3 - Article

VL - 8

SP - 261

EP - 272

JO - Applied Measurement in Education

JF - Applied Measurement in Education

SN - 0895-7347

IS - 3

ER -