Developments in practical nonparametric IRT scale analysis

K. Sijtsma

Research output: Chapter in Book/Report/Conference proceedingChapterScientific

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Original languageEnglish
Title of host publicationNew Developments on Psychometrics
EditorsH. Yanai, A. Okada, K. Shigemasu, Y. Kano, J.J. Meulman
Place of PublicationTokyo
Number of pages702
ISBN (Print)4431703438
Publication statusPublished - 2003

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