Developments in practical nonparametric IRT scale analysis

K. Sijtsma

Research output: Chapter in Book/Report/Conference proceedingChapterScientific

17 Downloads (Pure)
Original languageEnglish
Title of host publicationNew Developments on Psychometrics
EditorsH. Yanai, A. Okada, K. Shigemasu, Y. Kano, J.J. Meulman
Place of PublicationTokyo
PublisherSpringer
Pages183-190
Number of pages702
ISBN (Print)4431703438
Publication statusPublished - 2003

Cite this

Sijtsma, K. (2003). Developments in practical nonparametric IRT scale analysis. In H. Yanai, A. Okada, K. Shigemasu, Y. Kano, & J. J. Meulman (Eds.), New Developments on Psychometrics (pp. 183-190). Tokyo: Springer.
Sijtsma, K. / Developments in practical nonparametric IRT scale analysis. New Developments on Psychometrics. editor / H. Yanai ; A. Okada ; K. Shigemasu ; Y. Kano ; J.J. Meulman. Tokyo : Springer, 2003. pp. 183-190
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Sijtsma, K 2003, Developments in practical nonparametric IRT scale analysis. in H Yanai, A Okada, K Shigemasu, Y Kano & JJ Meulman (eds), New Developments on Psychometrics. Springer, Tokyo, pp. 183-190.

Developments in practical nonparametric IRT scale analysis. / Sijtsma, K.

New Developments on Psychometrics. ed. / H. Yanai; A. Okada; K. Shigemasu; Y. Kano; J.J. Meulman. Tokyo : Springer, 2003. p. 183-190.

Research output: Chapter in Book/Report/Conference proceedingChapterScientific

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BT - New Developments on Psychometrics

A2 - Yanai, H.

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A2 - Shigemasu, K.

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Sijtsma K. Developments in practical nonparametric IRT scale analysis. In Yanai H, Okada A, Shigemasu K, Kano Y, Meulman JJ, editors, New Developments on Psychometrics. Tokyo: Springer. 2003. p. 183-190