Original language | English |
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Title of host publication | New Developments on Psychometrics |
Editors | H. Yanai, A. Okada, K. Shigemasu, Y. Kano, J.J. Meulman |
Place of Publication | Tokyo |
Publisher | Springer |
Pages | 183-190 |
Number of pages | 702 |
ISBN (Print) | 4431703438 |
Publication status | Published - 2003 |
Developments in practical nonparametric IRT scale analysis
K. Sijtsma
Research output: Chapter in Book/Report/Conference proceeding › Chapter › Scientific
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