General and specific misfit of nonparametric IRT-models

M.J.H. van Onna

Research output: Chapter in Book/Report/Conference proceedingChapterScientific

Original languageEnglish
Title of host publicationNew developments in psychometrics
EditorsH. Yanai, A. Okada, K. Shigemasu, Y. Kano, J.J. Meulman
Place of PublicationTokyo
PublisherSpringer
Pages239-246
Publication statusPublished - 2003

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