Goodness of fit methods for nonparametric IRT models

K. Sijtsma; J.H. Straat; L.A. van der Ark

Goodness of fit methods for nonparametric IRT models

K. Sijtsma, J.H. Straat, L.A. van der Ark

Methodology and Statistics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	Quantitative psychology research: The 79th Annual Meeting of the Psychometric Society
Editors	L.A. van der Ark, D.M. Bolt, W.-C. Wang, J. Douglas, S.-M. Chow
Place of Publication	New York
Publisher	Springer
Pages	109-120
Publication status	Published - 2015
Event	79th Annual Meeting of the Psychometric Society - Madison, Wisconsin, United States Duration: 21 Jul 2014 → 25 Jul 2014

Conference

Conference	79th Annual Meeting of the Psychometric Society
Country/Territory	United States
City	Madison, Wisconsin
Period	21/07/14 → 25/07/14

Cite this

@inproceedings{51f1534839f0422286b532c7c7aee330,

title = "Goodness of fit methods for nonparametric IRT models",

author = "K. Sijtsma and J.H. Straat and {van der Ark}, L.A.",

year = "2015",

language = "English",

pages = "109--120",

editor = "{van der Ark}, L.A. and D.M. Bolt and W.-C. Wang and J. Douglas and S.-M. Chow",

booktitle = "Quantitative psychology research: The 79th Annual Meeting of the Psychometric Society",

publisher = "Springer",

address = "Germany",

note = "79th Annual Meeting of the Psychometric Society ; Conference date: 21-07-2014 Through 25-07-2014",

}

Sijtsma, K, Straat, JH & van der Ark, LA 2015, Goodness of fit methods for nonparametric IRT models. in LA van der Ark, DM Bolt, W-C Wang, J Douglas & S-M Chow (eds), Quantitative psychology research: The 79th Annual Meeting of the Psychometric Society. Springer, New York, pp. 109-120, 79th Annual Meeting of the Psychometric Society, Madison, Wisconsin, United States, 21/07/14.

Goodness of fit methods for nonparametric IRT models. / Sijtsma, K.; Straat, J.H.; van der Ark, L.A.
Quantitative psychology research: The 79th Annual Meeting of the Psychometric Society. ed. / L.A. van der Ark; D.M. Bolt; W.-C. Wang; J. Douglas; S.-M. Chow. New York: Springer, 2015. p. 109-120.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Goodness of fit methods for nonparametric IRT models

AU - Sijtsma, K.

AU - Straat, J.H.

AU - van der Ark, L.A.

PY - 2015

Y1 - 2015

M3 - Conference contribution

SP - 109

EP - 120

BT - Quantitative psychology research: The 79th Annual Meeting of the Psychometric Society

A2 - van der Ark, L.A.

A2 - Bolt, D.M.

A2 - Wang, W.-C.

A2 - Douglas, J.

A2 - Chow, S.-M.

PB - Springer

CY - New York

T2 - 79th Annual Meeting of the Psychometric Society

Y2 - 21 July 2014 through 25 July 2014

ER -