@techreport{a2f56beda5de445cbf6b97555c814a3c,
title = "Goodness-of-Fit Tests in Nonparametric Regression",
abstract = "AMS classifications: 62G08, 62G10, 62G20, 62G30; 60F17.",
keywords = "Bootstrap, empirical process, goodness-of-fit, location-scale regression, model diagnostics, nonparametric regression, test for independence, weak convergence",
author = "J.H.J. Einmahl and {van Keilegom}, I.",
note = "Subsequently published in the Journal of Econometrics, 2008 (rt) Pagination: 24",
year = "2006",
language = "English",
volume = "2006-79",
series = "CentER Discussion Paper",
publisher = "Econometrics",
type = "WorkingPaper",
institution = "Econometrics",
}