High p-values as a sign of data fabrication/falsification

C.H.J. Hartgerink, M.A.L.M. van Assen, J.M. Wicherts

Research output: Contribution to conferenceAbstractOther research output

Original languageEnglish
Publication statusPublished - 2016
Event4th World Conference on Research Integrity - Rio de Janeiro, Brazil
Duration: 31 May 20153 Jun 2015

Conference

Conference4th World Conference on Research Integrity
CountryBrazil
CityRio de Janeiro
Period31/05/153/06/15

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