Influence of Size on Pattern-based Sequence Classification

M. van Zaanen; T. Gaustad; J. Feijen

Influence of Size on Pattern-based Sequence Classification

M. van Zaanen, T. Gaustad, J. Feijen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	Proceedings of the 20th Belgian Dutch Conference on Machine Learning 2011
Editors	P. van der Putten, C. Veenman, Joaquin Vanschoren, Menno Israel, Hendrik Blockeel
Place of Publication	The Hague
Publisher	[s.n.]
Pages	53-60
Publication status	Published - 2011

Cite this

@inproceedings{aa22254f5c93499097411aa2eb1db1e5,

title = "Influence of Size on Pattern-based Sequence Classification",

author = "\{van Zaanen\}, M. and T. Gaustad and J. Feijen",

year = "2011",

language = "English",

pages = "53--60",

editor = "\{van der Putten\}, P. and C. Veenman and Joaquin Vanschoren and Menno Israel and Hendrik Blockeel",

booktitle = "Proceedings of the 20th Belgian Dutch Conference on Machine Learning 2011",

publisher = "[s.n.]",

}

Influence of Size on Pattern-based Sequence Classification. / van Zaanen, M.; Gaustad, T.; Feijen, J.
Proceedings of the 20th Belgian Dutch Conference on Machine Learning 2011. ed. / P. van der Putten; C. Veenman; Joaquin Vanschoren; Menno Israel; Hendrik Blockeel. The Hague: [s.n.], 2011. p. 53-60.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Influence of Size on Pattern-based Sequence Classification

AU - van Zaanen, M.

AU - Gaustad, T.

AU - Feijen, J.

PY - 2011

Y1 - 2011

M3 - Conference contribution

SP - 53

EP - 60

BT - Proceedings of the 20th Belgian Dutch Conference on Machine Learning 2011

A2 - van der Putten, P.

A2 - Veenman, C.

A2 - Vanschoren, Joaquin

A2 - Israel, Menno

A2 - Blockeel, Hendrik

PB - [s.n.]

CY - The Hague

ER -