Insights from Amazon Reviews through Machine Learning-Aided Sentiment Analysis and NMF-based Topic Modeling

Wenjie Dang; Nevena Ranković

doi:10.1109/ITMS67030.2025.11236554

Insights from Amazon Reviews through Machine Learning-Aided Sentiment Analysis and NMF-based Topic Modeling

Wenjie Dang
, Nevena Ranković

Intelligent Systems

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	2025 IEEE 66th International Scientific Conference on Information Technology and Management Science
Publisher	IEEE
Number of pages	8
ISBN (Electronic)	979-8-3315-4528-4
ISBN (Print)	979-8-3315-4529-1
DOIs	https://doi.org/10.1109/ITMS67030.2025.11236554
Publication status	Accepted/In press - Sept 2025
Event	International Scientific Conference on Information Technology and Management Science of Riga Technical University - Riga, Latvia Duration: 9 Oct 2025 → 10 Oct 2025 Conference number: 66

Conference

Conference	International Scientific Conference on Information Technology and Management Science of Riga Technical University
Abbreviated title	ITMS
Country/Territory	Latvia
City	Riga
Period	9/10/25 → 10/10/25

Access to Document

10.1109/ITMS67030.2025.11236554

Cite this

@inproceedings{29131cacd7454d9198039e2ce442e05b,

title = "Insights from Amazon Reviews through Machine Learning-Aided Sentiment Analysis and NMF-based Topic Modeling",

author = "Wenjie Dang and Nevena Rankovi{\'c}",

year = "2025",

month = sep,

doi = "10.1109/ITMS67030.2025.11236554",

language = "English",

isbn = "979-8-3315-4529-1",

booktitle = "2025 IEEE 66th International Scientific Conference on Information Technology and Management Science",

publisher = "IEEE",

note = "International Scientific Conference on Information Technology and Management Science of Riga Technical University, ITMS ; Conference date: 09-10-2025 Through 10-10-2025",

}

Dang, W & Ranković, N 2025, Insights from Amazon Reviews through Machine Learning-Aided Sentiment Analysis and NMF-based Topic Modeling. in 2025 IEEE 66th International Scientific Conference on Information Technology and Management Science. IEEE, International Scientific Conference on Information Technology and Management Science of Riga Technical University, Riga, Latvia, 9/10/25. https://doi.org/10.1109/ITMS67030.2025.11236554

Insights from Amazon Reviews through Machine Learning-Aided Sentiment Analysis and NMF-based Topic Modeling. / Dang, Wenjie; Ranković, Nevena.
2025 IEEE 66th International Scientific Conference on Information Technology and Management Science. IEEE, 2025.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Insights from Amazon Reviews through Machine Learning-Aided Sentiment Analysis and NMF-based Topic Modeling

AU - Dang, Wenjie

AU - Ranković, Nevena

N1 - Conference code: 66

PY - 2025/9

Y1 - 2025/9

U2 - 10.1109/ITMS67030.2025.11236554

DO - 10.1109/ITMS67030.2025.11236554

M3 - Conference contribution

SN - 979-8-3315-4529-1

BT - 2025 IEEE 66th International Scientific Conference on Information Technology and Management Science

PB - IEEE

T2 - International Scientific Conference on Information Technology and Management Science of Riga Technical University

Y2 - 9 October 2025 through 10 October 2025

ER -