International Test Commission

Its history, current status, and future directions

T. Oakland, Y.H. Poortinga, J. Schlegel, R.K. Hambleton

Research output: Contribution to journalArticleScientificpeer-review

Original languageEnglish
Pages (from-to)3-32
JournalInternational Journal of Testing
Volume1
Publication statusPublished - 2001

Cite this

@article{7bd84b5155034b378a7970fb4fc1c1c4,
title = "International Test Commission: Its history, current status, and future directions",
author = "T. Oakland and Y.H. Poortinga and J. Schlegel and R.K. Hambleton",
year = "2001",
language = "English",
volume = "1",
pages = "3--32",
journal = "International Journal of Testing",
issn = "1530-5058",
publisher = "Routledge",

}

International Test Commission : Its history, current status, and future directions. / Oakland, T.; Poortinga, Y.H.; Schlegel, J.; Hambleton, R.K.

In: International Journal of Testing, Vol. 1, 2001, p. 3-32.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - International Test Commission

T2 - Its history, current status, and future directions

AU - Oakland, T.

AU - Poortinga, Y.H.

AU - Schlegel, J.

AU - Hambleton, R.K.

PY - 2001

Y1 - 2001

M3 - Article

VL - 1

SP - 3

EP - 32

JO - International Journal of Testing

JF - International Journal of Testing

SN - 1530-5058

ER -