| Original language | English |
|---|---|
| Pages (from-to) | 3-32 |
| Journal | International Journal of Testing |
| Volume | 1 |
| Publication status | Published - 2001 |
Cite this
Oakland, T., Poortinga, Y. H., Schlegel, J., & Hambleton, R. K. (2001). International Test Commission: Its history, current status, and future directions. International Journal of Testing, 1, 3-32.
@article{7bd84b5155034b378a7970fb4fc1c1c4,
title = "International Test Commission: Its history, current status, and future directions",
author = "T. Oakland and Y.H. Poortinga and J. Schlegel and R.K. Hambleton",
year = "2001",
language = "English",
volume = "1",
pages = "3--32",
journal = "International Journal of Testing",
issn = "1530-5058",
publisher = "Routledge",
}
Oakland, T, Poortinga, YH, Schlegel, J & Hambleton, RK 2001, 'International Test Commission: Its history, current status, and future directions', International Journal of Testing, vol. 1, pp. 3-32.
International Test Commission : Its history, current status, and future directions. / Oakland, T.; Poortinga, Y.H.; Schlegel, J.; Hambleton, R.K.
In: International Journal of Testing, Vol. 1, 2001, p. 3-32.Research output: Contribution to journal › Article › Scientific › peer-review
TY - JOUR
T1 - International Test Commission
T2 - Its history, current status, and future directions
AU - Oakland, T.
AU - Poortinga, Y.H.
AU - Schlegel, J.
AU - Hambleton, R.K.
PY - 2001
Y1 - 2001
M3 - Article
VL - 1
SP - 3
EP - 32
JO - International Journal of Testing
JF - International Journal of Testing
SN - 1530-5058
ER -
Oakland T, Poortinga YH, Schlegel J, Hambleton RK. International Test Commission: Its history, current status, and future directions. International Journal of Testing. 2001;1:3-32.