| Original language | English |
|---|---|
| Title of host publication | Handbook of diagnostic classification models |
| Subtitle of host publication | State of the art in modeling, estimation, and applications |
| Editors | M. von Davier, Y.-S. Lee |
| Place of Publication | New York |
| Publisher | Springer |
| Chapter | 2 |
| Pages | 21-45 |
| Publication status | Published - 2019 |
Nonparametric item response theory and Mokken scale analysis, with relations to latent class models and cognitive diagnostic models
L.A. van der Ark, G. Rossi, K. Sijtsma
Research output: Chapter in Book/Report/Conference proceeding › Chapter › Scientific › peer-review