Original language | English |
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Publisher | IEEE Computer Society |
Number of pages | 10 |
ISBN (Print) | 0-7803-3541-4 |
Publication status | Published - 1996 |
Externally published | Yes |
Optimal scan for pipelined testing: an asynchronous foundation
M. Roncken, E.H.L. Aarts, W.F.J. Verhaegh
Research output: Other contribution
18
Citations
(Scopus)