| Original language | English |
|---|---|
| Publisher | IEEE Computer Society |
| Number of pages | 10 |
| ISBN (Print) | 0-7803-3541-4 |
| Publication status | Published - 1996 |
| Externally published | Yes |
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Optimal scan for pipelined testing: an asynchronous foundation
- M. Roncken
- , E.H.L. Aarts
- , W.F.J. Verhaegh
Research output: Other contribution
18
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