Outliers Detection in Multi-label Datasets

  • Marilyn Bello*
  • , Gonzalo Nápoles
  • , Rafael Morera
  • , Koen Vanhoof
  • , Rafael Bello
  • *Corresponding author for this work

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    4 Citations (Scopus)

    Abstract

    In many knowledge discovery applications, finding outliers, i.e. objects that behave in an unexpected way or have abnormal properties, is more interesting than finding inliers in a dataset. Outlier detection is important for many applications, including those related to intrusion detection, credit card fraud, and criminal activity in e-commerce. Several methods of outlier detection have been proposed, and even many of them from the perspective of Rough Set Theory, but at the moment none of them is specifically intended for multi-label datasets. In this paper, we propose a method that measures the degree of anomaly of an object in a multi-label dataset. This score or measure quantifies the degree of irregularity of an object with respect to the dataset. In addition, a method for generating anomalies in this type of datasets is proposed. From these synthetic datasets, the efficacy of the proposed method is proved. The results show the superiority of our proposal over other methods in the literature adapted to multi-label problems.

    Original languageEnglish
    Title of host publicationAdvances in Soft Computing - 19th Mexican International Conference on Artificial Intelligence, MICAI 2020, Proceedings
    EditorsLourdes Martínez-Villaseñor, Hiram Ponce, Oscar Herrera-Alcántara, Félix A. Castro-Espinoza
    PublisherSpringer Science and Business Media Deutschland GmbH
    Pages65-75
    Number of pages11
    ISBN (Print)9783030608835
    DOIs
    Publication statusPublished - 2020
    Event19th Mexican International Conference on Artificial Intelligence, MICAI 2020 - Mexico City, Mexico
    Duration: 12 Oct 202017 Oct 2020

    Publication series

    NameLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
    Volume12468 LNAI
    ISSN (Print)0302-9743
    ISSN (Electronic)1611-3349

    Conference

    Conference19th Mexican International Conference on Artificial Intelligence, MICAI 2020
    Country/TerritoryMexico
    CityMexico City
    Period12/10/2017/10/20

    Keywords

    • Knowledge discovery
    • Multi-label datasets
    • Outlier detection
    • Outlier generation
    • Rough set theory

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