Possibilities and challenges in Mokken scale analysis using marginal models

L.A. van der Ark, M.A. Croon, K. Sijtsma

Research output: Chapter in Book/Report/Conference proceedingChapterScientific

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Original languageEnglish
Title of host publicationNew trends in psychometrics
EditorsK. Shigemasu, A. Okada, T. Imaizuma, T. Hodhina
Place of PublicationTokyo
PublisherUniversal Academic Press
Publication statusPublished - 2008

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