Possibilities and challenges in Mokken scale analysis using marginal models

L.A. van der Ark, M.A. Croon, K. Sijtsma

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Original language	English
Title of host publication	New trends in psychometrics
Editors	K. Shigemasu, A. Okada, T. Imaizuma, T. Hodhina
Place of Publication	Tokyo
Publisher	Universal Academic Press
Pages	525-532
Publication status	Published - 2008

Access to Document

@inbook{a81c4ee8bbe34bca9912c88b06d8f505,

title = "Possibilities and challenges in Mokken scale analysis using marginal models",

author = "{van der Ark}, L.A. and M.A. Croon and K. Sijtsma",

year = "2008",

language = "English",

pages = "525--532",

editor = "K. Shigemasu and A. Okada and T. Imaizuma and T. Hodhina",

booktitle = "New trends in psychometrics",

publisher = "Universal Academic Press",

}