Possibilities and challenges in Mokken scale analysis using marginal models

L.A. van der Ark, M.A. Croon, K. Sijtsma

Research output: Chapter in Book/Report/Conference proceeding › Chapter › Scientific

103 Downloads (Pure)

Original language	English
Title of host publication	New trends in psychometrics
Editors	K. Shigemasu, A. Okada, T. Imaizuma, T. Hodhina
Place of Publication	Tokyo
Publisher	Universal Academic Press
Pages	525-532
Publication status	Published - 2008

Access to Document

@inbook{a81c4ee8bbe34bca9912c88b06d8f505,

title = "Possibilities and challenges in Mokken scale analysis using marginal models",

author = "{van der Ark}, L.A. and M.A. Croon and K. Sijtsma",

year = "2008",

language = "English",

pages = "525--532",

editor = "K. Shigemasu and A. Okada and T. Imaizuma and T. Hodhina",

booktitle = "New trends in psychometrics",

publisher = "Universal Academic Press",

}