Original language | English |
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Title of host publication | New trends in psychometrics |
Editors | K. Shigemasu, A. Okada, T. Imaizuma, T. Hodhina |
Place of Publication | Tokyo |
Publisher | Universal Academic Press |
Pages | 525-532 |
Publication status | Published - 2008 |
Possibilities and challenges in Mokken scale analysis using marginal models
L.A. van der Ark, M.A. Croon, K. Sijtsma
Research output: Chapter in Book/Report/Conference proceeding › Chapter › Scientific
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