Some Alternative Clustering Methods for Mokken Scale Analysis

A.A.H. van Abswoude, J.K. Vermunt

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Original language	English
Title of host publication	New Developments in Psychometrics.
Editors	H. Yanai, A. Okada, K. Shigemasu, Y. Kano, J.J. Meulman
Place of Publication	Tokyo
Publisher	Springer
Pages	623-630
ISBN (Print)	4431703438
Publication status	Published - 2003

Access to Document

@inbook{0858159ac0584eb288dcde27d5400316,

title = "Some Alternative Clustering Methods for Mokken Scale Analysis",

author = "{van Abswoude}, A.A.H. and J.K. Vermunt",

note = "Proceedings of the International Meeting of the Psychometric Society, IMPS-2001",

year = "2003",

language = "English",

isbn = "4431703438",

pages = "623--630",

editor = "H. Yanai and A. Okada and K. Shigemasu and Y. Kano and J.J. Meulman",

booktitle = "New Developments in Psychometrics.",

publisher = "Springer",

address = "Germany",

}

TY - CHAP

T1 - Some Alternative Clustering Methods for Mokken Scale Analysis

AU - van Abswoude, A.A.H.

AU - Vermunt, J.K.

N1 - Proceedings of the International Meeting of the Psychometric Society, IMPS-2001

PY - 2003

Y1 - 2003

M3 - Chapter

SN - 4431703438

SP - 623

EP - 630

BT - New Developments in Psychometrics.

A2 - Yanai, H.

A2 - Okada, A.

A2 - Shigemasu, K.

A2 - Kano, Y.

A2 - Meulman, J.J.

PB - Springer

CY - Tokyo

ER -