Some Alternative Clustering Methods for Mokken Scale Analysis

A.A.H. van Abswoude, J.K. Vermunt

Research output: Chapter in Book/Report/Conference proceedingChapterScientific

116 Downloads (Pure)
Original languageEnglish
Title of host publicationNew Developments in Psychometrics.
EditorsH. Yanai, A. Okada, K. Shigemasu, Y. Kano, J.J. Meulman
Place of PublicationTokyo
ISBN (Print)4431703438
Publication statusPublished - 2003

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