Some Alternative Clustering Methods for Mokken Scale Analysis

A.A.H. van Abswoude, J.K. Vermunt

Research output: Chapter in Book/Report/Conference proceedingChapterScientific

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Original languageEnglish
Title of host publicationNew Developments in Psychometrics.
EditorsH. Yanai, A. Okada, K. Shigemasu, Y. Kano, J.J. Meulman
Place of PublicationTokyo
PublisherSpringer
Pages623-630
ISBN (Print)4431703438
Publication statusPublished - 2003

Cite this

van Abswoude, A. A. H., & Vermunt, J. K. (2003). Some Alternative Clustering Methods for Mokken Scale Analysis. In H. Yanai, A. Okada, K. Shigemasu, Y. Kano, & J. J. Meulman (Eds.), New Developments in Psychometrics. (pp. 623-630). Tokyo: Springer.
van Abswoude, A.A.H. ; Vermunt, J.K. / Some Alternative Clustering Methods for Mokken Scale Analysis. New Developments in Psychometrics.. editor / H. Yanai ; A. Okada ; K. Shigemasu ; Y. Kano ; J.J. Meulman. Tokyo : Springer, 2003. pp. 623-630
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van Abswoude, AAH & Vermunt, JK 2003, Some Alternative Clustering Methods for Mokken Scale Analysis. in H Yanai, A Okada, K Shigemasu, Y Kano & JJ Meulman (eds), New Developments in Psychometrics.. Springer, Tokyo, pp. 623-630.

Some Alternative Clustering Methods for Mokken Scale Analysis. / van Abswoude, A.A.H.; Vermunt, J.K.

New Developments in Psychometrics.. ed. / H. Yanai; A. Okada; K. Shigemasu; Y. Kano; J.J. Meulman. Tokyo : Springer, 2003. p. 623-630.

Research output: Chapter in Book/Report/Conference proceedingChapterScientific

TY - CHAP

T1 - Some Alternative Clustering Methods for Mokken Scale Analysis

AU - van Abswoude, A.A.H.

AU - Vermunt, J.K.

N1 - Proceedings of the International Meeting of the Psychometric Society, IMPS-2001

PY - 2003

Y1 - 2003

M3 - Chapter

SN - 4431703438

SP - 623

EP - 630

BT - New Developments in Psychometrics.

A2 - Yanai, H.

A2 - Okada, A.

A2 - Shigemasu, K.

A2 - Kano, Y.

A2 - Meulman, J.J.

PB - Springer

CY - Tokyo

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van Abswoude AAH, Vermunt JK. Some Alternative Clustering Methods for Mokken Scale Analysis. In Yanai H, Okada A, Shigemasu K, Kano Y, Meulman JJ, editors, New Developments in Psychometrics.. Tokyo: Springer. 2003. p. 623-630