Statistical analyses of scatter plots to identify important factors in large-scale simulations, 2: Robustness of techniques

J.P.C. Kleijnen, J.C. Helton

Research output: Contribution to journalArticleScientificpeer-review

Original languageEnglish
Pages (from-to)187-197
Number of pages10
JournalReliability Engineering and System Safety
Volume65
Issue number2
Publication statusPublished - 1999

Cite this

@article{519ee52dbbe44379ae158f13fa75ee36,
title = "Statistical analyses of scatter plots to identify important factors in large-scale simulations, 2: Robustness of techniques",
author = "J.P.C. Kleijnen and J.C. Helton",
note = "Pagination: 10",
year = "1999",
language = "English",
volume = "65",
pages = "187--197",
journal = "Reliability Engineering and System Safety",
issn = "0951-8320",
publisher = "Elsevier Limited",
number = "2",

}

Statistical analyses of scatter plots to identify important factors in large-scale simulations, 2 : Robustness of techniques. / Kleijnen, J.P.C.; Helton, J.C.

In: Reliability Engineering and System Safety, Vol. 65, No. 2, 1999, p. 187-197.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - Statistical analyses of scatter plots to identify important factors in large-scale simulations, 2

T2 - Robustness of techniques

AU - Kleijnen, J.P.C.

AU - Helton, J.C.

N1 - Pagination: 10

PY - 1999

Y1 - 1999

M3 - Article

VL - 65

SP - 187

EP - 197

JO - Reliability Engineering and System Safety

JF - Reliability Engineering and System Safety

SN - 0951-8320

IS - 2

ER -