Two-way imputation: A Bayesian method for estimating missing scores in tests and questionnaires, and an accurate approximation

J.R. van Ginkel, L.A. van der Ark, K. Sijtsma, J.K. Vermunt

Research output: Contribution to journalArticleScientificpeer-review

21 Citations (Scopus)
165 Downloads (Pure)
Original languageEnglish
Pages (from-to)4013-4027
JournalComputational Statistics and Data Analysis
Volume51
Issue number8
Publication statusPublished - 2007

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