Two-way imputation

A Bayesian method for estimating missing scores in tests and questionnaires, and an accurate approximation

J.R. van Ginkel, L.A. van der Ark, K. Sijtsma, J.K. Vermunt

Research output: Contribution to journalArticleScientificpeer-review

119 Downloads (Pure)
Original languageEnglish
Pages (from-to)4013-4027
JournalComputational Statistics and Data Analysis
Volume51
Issue number8
Publication statusPublished - 2007

Cite this

@article{2a74d78aa7694415b87dd25de6014d76,
title = "Two-way imputation: A Bayesian method for estimating missing scores in tests and questionnaires, and an accurate approximation",
author = "{van Ginkel}, J.R. and {van der Ark}, L.A. and K. Sijtsma and J.K. Vermunt",
year = "2007",
language = "English",
volume = "51",
pages = "4013--4027",
journal = "Computational Statistics & Data Analysis",
issn = "0167-9473",
publisher = "Elsevier",
number = "8",

}

Two-way imputation : A Bayesian method for estimating missing scores in tests and questionnaires, and an accurate approximation. / van Ginkel, J.R.; van der Ark, L.A.; Sijtsma, K.; Vermunt, J.K.

In: Computational Statistics and Data Analysis, Vol. 51, No. 8, 2007, p. 4013-4027.

Research output: Contribution to journalArticleScientificpeer-review

TY - JOUR

T1 - Two-way imputation

T2 - A Bayesian method for estimating missing scores in tests and questionnaires, and an accurate approximation

AU - van Ginkel, J.R.

AU - van der Ark, L.A.

AU - Sijtsma, K.

AU - Vermunt, J.K.

PY - 2007

Y1 - 2007

M3 - Article

VL - 51

SP - 4013

EP - 4027

JO - Computational Statistics & Data Analysis

JF - Computational Statistics & Data Analysis

SN - 0167-9473

IS - 8

ER -