Two-way imputation: A Bayesian method for estimating missing scores in tests and questionnaires, and an accurate approximation

J.R. van Ginkel, L.A. van der Ark, K. Sijtsma, J.K. Vermunt

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34 Citations (Scopus)

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Original language	English
Pages (from-to)	4013-4027
Journal	Computational Statistics and Data Analysis
Volume	51
Issue number	8
Publication status	Published - 2007

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title = "Two-way imputation: A Bayesian method for estimating missing scores in tests and questionnaires, and an accurate approximation",

author = "{van Ginkel}, J.R. and {van der Ark}, L.A. and K. Sijtsma and J.K. Vermunt",

year = "2007",

language = "English",

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journal = "Computational Statistics and Data Analysis",

issn = "0167-9473",

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T2 - A Bayesian method for estimating missing scores in tests and questionnaires, and an accurate approximation

AU - van Ginkel, J.R.

AU - van der Ark, L.A.

AU - Sijtsma, K.

AU - Vermunt, J.K.

PY - 2007

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M3 - Article

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VL - 51

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JO - Computational Statistics and Data Analysis

JF - Computational Statistics and Data Analysis

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